Phase noise is an important parameter in wireless communications systems. The R&S FPL1-K40 option enables the R&S FPL1000 to perform fast and easy phase noise measurements in development and production.

Equipped with the R&S FPL1-K40 option, the R&S FPL1000 can measure single-sideband phase noise across a selectable carrier offset frequency range displayed on a logarithmic axis. Based on the measured phase noise, the user can determine the residual FM/φM and the jitter.

Phase noise measurement

• Carrier offset frequency range selectable from 1 Hz to 1 GHz in 1/3/10 sequence (1 Hz, 3 Hz, 10 Hz, 30 Hz, etc.)
• Number of averages, sweep mode and filter bandwidth can be individually selected for every measurement subrange to optimize the measurement speed
• Fast results for the subranges are obtained by starting the measurement at the maximum carrier offset
• Verification of carrier frequency and power prior to each measurement to prevent incorrect measurements
• Improvement of dynamic range by measuring the inherent thermal noise and performing noise correction

Measurement of residual FM/φM and jitter

• Integration across the entire selected carrier offset frequency range or across a selectable subrange
• Tabular display of residual FM, residual φM, and RMS jitter in addition to measurement trace

*The image is for reference only. See product specification for details.